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Bsr52 npn darlington transistor

NPN Darlington transistor
NXP Semiconductors
Product data sheet
NPN Darlington transistor
• Industrial high gain amplification.
NPN Darlington transistor in a TO-92; SOT54 plastic Simplified outline (TO-92; SOT54) and symbol.
plastic single-ended leaded (through hole) package; 3 leads LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134).
Transistor mounted on an FR4 printed-circuit board.
thermal resistance from junction to ambient Transistor mounted on an FR4 printed-circuit board.
Tamb = 25 °C unless otherwise specified.
collector-emitter saturation voltage IC = 0.5 A; IB = 0.5 mA Switching times (between 10% and 90% levels); see
Fig.2 DC current gain; typical values.
Vi = 10 V; T = 200 μs; tp = 6 μs; tr = tf ≤ 3 ns.
R1 = 56 Ω; R2 = 10 kΩ; RB = 10 kΩ; RC = 18 Ω.
VBB = −1.8 V; VCC = 10.7 V.
Oscilloscope: input impedance Zi = 50 Ω.
Fig.3 Test circuit for switching times.
Plastic single-ended leaded (through hole) package; 3 leads
DIMENSIONS (mm are the original dimensions)
1. Terminal dimensions within this zone are uncontrolled to allow for flow of plastic and terminal irregularities.
This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification. Please consult the most recently issued document before initiating or completing a design.
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL DISCLAIMERS
the device. Limiting values are stress ratings only and operation of the device at these or any other conditions General ⎯ Information in this document is believed to be
above those given in the Characteristics sections of this accurate and reliable. However, NXP Semiconductors document is not implied. Exposure to limiting values for does not give any representations or warranties, extended periods may affect device reliability.
expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the Terms and conditions of sale
consequences of use of such information.
Right to make changes ⎯ NXP Semiconductors
reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof.
Suitability for use ⎯ NXP Semiconductors products are
not designed, authorized or warranted to be suitable for No offer to sell or license ⎯ Nothing in this document
use in medical, military, aircraft, space or life support may be interpreted or construed as an offer to sell products equipment, nor in applications where failure or malfunction that is open for acceptance or the grant, conveyance or of an NXP Semiconductors product can reasonably be implication of any license under any copyrights, patents or expected to result in personal injury, death or severe other industrial or intellectual property rights.
property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Export control ⎯ This document as well as the item(s)
Semiconductors products in such equipment or described herein may be subject to export control applications and therefore such inclusion and/or use is at regulations. Export might require a prior authorization from Applications ⎯ Applications that are described herein for
Quick reference data ⎯ The Quick reference data is an
any of these products are for illustrative purposes only. extract of the product data given in the Limiting values and NXP Semiconductors makes no representation or Characteristics sections of this document, and as such is warranty that such applications will be suitable for the not complete, exhaustive or legally binding. specified use without further testing or modification.
Limiting values ⎯ Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
NXP Semiconductors
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